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EquipmentResult of searching: found 37 devices on 4 pages (10 devices per page). SEM/STEM HITACHI S 5500
Scanning Electron Microscope HITACHI S5500 is powerful tool for investigations of materials microstructure in nanoscale. Microscope has special column design, which minimize influence of lenses imperfection on the electron beam. In this microscope we can observe simultaneously the specimen in... more » FIB Focused Ion BeamFocused Ion beam instrument type FB2100 made by Hitachi, it is very modern tool for preparation samples and investigations of materials microstructure, which are difficult for preparation traditional techiques. On this unit, composite materials like diamond particles in metallic matrix, thin layers,... more » Scanning electron microscope HITACHI S-3500N
Scanning electron microscope HITACHI S-3500N equipped with secondary and backscatter detectors as well as Robinson detector. The microscope is able to work at variable pressure conditions of vacuum (ability of non-conductive materials analysis). Features High resolution imaging in both... more » Optical Surface Profiler Wyko NT9300
The Wyko NT9300 optical surface profiler offer a quick, easy, and reliable way to make non-contact 3-D measurements of many different surface and samples with sub-nanometer resolution. Wyko NT9300 optical profiling system consists of key components that work together to provide detailed information... more » Scanning Probe Microscope MultiMode AFM V
Scanning Probe Microscope MultiMode AFM V with Active vibration isolation table Modes: CM - contact mode (including in fluids operation); LFM - lateral force microscopy; TM - tapping mode AFM; HSTM - high speed tapping mode AFM; PI - phase imaging; TR - torsion... more » Transmission Electron Microscopes: (HRTEM) JEOL JEM 3010, (STEM) JEOL JEM 1200 EX, (TEM) Philips EM 300
Materials characterization by Transmission Electron Microscopy Equipment available at the Faculty of Materials Science and Engineering at the Warsaw University of Technology offers a wide spectrum of the TEM investigations. Quality of the machines and workers’ long experience allows... more » X-ray Diffractometer D8 DISCOVER Series 2 by Bruker AXS
The D8 DISCOVER Series 2 is a state of the art X-ray Diffractometer system that is easy to use, highly accurate, and versatile to meet all needs in X-ray diffraction. The heart of the D8 DISCOVER Series 2 is the high-precision, two-circle goniometr with independent stepper motors and optical... more » Electron Probe Micro Analyzer (EPMA)
X-ray microanalyser CAMECA SEMPROBE SU-30 equipped with 2 WDS and EDS (NORAN Voyager 3100). The instrument makes possible to detect all elements start from Be in microareas. Advanced softwares for quantitative analysis of bulk samples, thin layers and small particles as well as for image analysis... more » X-ray diffractometer PHILIPS PW 1830 equipped with attachment for thin film analysis
- qualitative phase analysis - ICDD search/match program, - quantitative phase analysis – our own Excel-type sheets, - microstresses and grain size analysis – DHN fitting plus our own Excel-type sheets - lattice parameters – DHN program, - ... more » |
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